2005 International Conference on Computer Design
At-Speed Logic BIST Architecture for Multi-Clock Designs
San Jose, California
October 02-October 05
ISBN: 0-7695-2451-6
DOI Bookmark:
http://doi.ieeecomputersociety.org/10.1109/ICCD.2005.119
This paper presents an at-speed logic BIST architecture for testing multi-clock, multi-frequency designs. The scheme employed allows true at-speed test quality for circuits containing multiple clocks without any clock frequency manipulation. Physical implementation is easily achieved due to the use of a low-speed scan enable (SE) signal and reduced timing-critical design requirements. Application results for two industrial designs are also reported.
Citation:
Laung-Terng Wang, Xiaoqing Wen, Po-Ching Hsu, Shianling Wu, Jonhson Guo, "At-Speed Logic BIST Architecture for Multi-Clock Designs," iccd, pp.475-478, 2005 International Conference on Computer Design, 2005
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