2005 International Conference on Computer Design Towards finding path delay fault tests with high test efficiency using ZBDDs San Jose, California October 02-October 05 ISBN: 0-7695-2451-6
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICCD.2005.109
A function representing Path Delay Faults (PDFs) together with their non-robust test cubes is presented. The function is manipulated effectively using Zero Suppressed Binary Decision Diagrams (ZBDDs) and Irredundant Sum of Products (ISOPs) in ZBDD-based representation, and is derived using a polynomial number, to the circuit size, of standard ZBDD operations. This new data structure can be used effectively during the ATPG process to derive high quality test sets. Experimental results demonstrate that the proposed structure can be implemented efficiently.
Citation:
Maria K. Michael, Kyriakos Christou, Spyros Tragoudas, "Towards finding path delay fault tests with high test efficiency using ZBDDs," iccd, pp.464-467, 2005 International Conference on Computer Design, 2005 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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