2004 IEEE International Conference on Computer Design (ICCD'04)
Quality Improvement Methods for System-Level Stimuli Generation
San Jose, CA
October 11-October 13
ISBN: 0-7695-2231-9
Functional verification of systems is aimed at validating the integration of previously verified components. It deals with complex designs, and invariably suffers from scarce resources. We present a set of methods, collectively known as testing knowledge, aimed at increasing the quality of automatically generated system-level test-cases. Testing knowledge reduces the time and effort required to achieve high coverage of the verified design.
Citation:
Roy Emek, Itai Jaeger, Yoav Katz, Yehuda Naveh, "Quality Improvement Methods for System-Level Stimuli Generation," iccd, pp.204-206, 2004 IEEE International Conference on Computer Design (ICCD'04), 2004
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