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2004 IEEE International Conference on Computer Design (ICCD'04)
On Undetectable Faults in Partial Scan Circuits Using Transparent-Scan
San Jose, CA
October 11-October 13
ISBN: 0-7695-2231-9
ASCII Text
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Irith Pomeranz, Sudhakar M. Reddy, "On Undetectable Faults in Partial Scan Circuits Using Transparent-Scan," Computer Design, International Conference on, pp. 82-84, 2004 IEEE International Conference on Computer Design (ICCD'04), 2004.
 
 
BibTex
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@article{ 10.1109/ICCD.2004.1347904,
author = {Irith Pomeranz and Sudhakar M. Reddy},
title = {On Undetectable Faults in Partial Scan Circuits Using Transparent-Scan},
journal ={Computer Design, International Conference on},
volume = {0},
year = {2004},
issn = {1063-6404},
pages = {82-84},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2004.1347904},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Computer Design, International Conference on
TI - On Undetectable Faults in Partial Scan Circuits Using Transparent-Scan
SN - 1063-6404
SP82
EP84
A1 - Irith Pomeranz,
A1 - Sudhakar M. Reddy,
PY - 2004
KW - null
VL - 0
JA - Computer Design, International Conference on
ER -
 
Irith Pomeranz, Purdue University, W. Lafayette, IN
Sudhakar M. Reddy, University of Iowa, Iowa City
We study the undetectable faults in partial scan circuits under a test application scheme referred to as transparent-scan. The transparent-scan approach allows very aggressive test compaction compared to other approaches. We demonstrate that, unlike other approaches that provide high levels of test compaction for partial scan circuits, this approach does not increase the number of undetectable faults. We also discuss the monotonicity of the number of undetectable faults with increased levels of scan.
Citation:
Irith Pomeranz, Sudhakar M. Reddy, "On Undetectable Faults in Partial Scan Circuits Using Transparent-Scan," iccd, pp.82-84, 2004 IEEE International Conference on Computer Design (ICCD'04), 2004
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