Power-Time Tradeoff in Test Scheduling for SoCs

I
ICCD
2003
2003 IEEE International Conference on Computer Design (ICCD'03)
Abstract - Power-Time Tradeoff in Test Scheduling for SoCs

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	Similar Articles Articles by Mehrdad Nourani Articles by James Chin

2003 IEEE International Conference on Computer Design (ICCD'03)

San Jose, California

October 13-October 15

ISBN: 0-7695-2025-1

	ASCII Text	x
	Mehrdad Nourani, James Chin, "Power-Time Tradeoff in Test Scheduling for SoCs," Computer Design, International Conference on, pp. 548, 2003 IEEE International Conference on Computer Design (ICCD'03), 2003.

	BibTex	x
	@article{ 10.1109/ICCD.2003.1240954, author = {Mehrdad Nourani and James Chin}, title = {Power-Time Tradeoff in Test Scheduling for SoCs}, journal ={Computer Design, International Conference on}, volume = {0}, year = {2003}, issn = {1063-6404}, pages = {548}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2003.1240954}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Computer Design, International Conference on TI - Power-Time Tradeoff in Test Scheduling for SoCs SN - 1063-6404 SP EP A1 - Mehrdad Nourani, A1 - James Chin, PY - 2003 KW - null VL - 0 JA - Computer Design, International Conference on ER -

Mehrdad Nourani, The University of Texas at Dallas

James Chin, The University of Texas at Dallas

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICCD.2003.1240954

We present a test scheduling methodology for core-based system-on-chips that allows tradeoff between system power dissipation and overall test time. The basic strategy is to use the power profile of non-embedded cores to find the best mix of their test pattern subsets that satisfy the power and/or time constraints. An MILP formulation is presented to globally perform the power-time tradeoff and produce the SoC test schedule. Many constraints including peak/average power of cores, time/sequencing requirements, and ATE pin limitation are also incorporated within this formulation.

Citation:

Mehrdad Nourani, James Chin, "Power-Time Tradeoff in Test Scheduling for SoCs," iccd, pp.548, 2003 IEEE International Conference on Computer Design (ICCD'03), 2003

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