Fault Dictionary Size Reduction through Test Response Superposition

I
ICCD
2002
2002 IEEE International Conference on Computer Design (ICCD'02)
Abstract - Fault Dictionary Size Reduction through Test Response Superposition

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2002 IEEE International Conference on Computer Design (ICCD'02)

Freiburg, Germany

September 16-September 18

ISBN: 0-7695-1700-5

	ASCII Text	x
	Baris Arslan, Alex Orailoglu, "Fault Dictionary Size Reduction through Test Response Superposition," Computer Design, International Conference on, pp. 480, 2002 IEEE International Conference on Computer Design (ICCD'02), 2002.

	BibTex	x
	@article{ 10.1109/ICCD.2002.1106817, author = {Baris Arslan and Alex Orailoglu}, title = {Fault Dictionary Size Reduction through Test Response Superposition}, journal ={Computer Design, International Conference on}, volume = {0}, year = {2002}, issn = {1063-6404}, pages = {480}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2002.1106817}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Computer Design, International Conference on TI - Fault Dictionary Size Reduction through Test Response Superposition SN - 1063-6404 SP EP A1 - Baris Arslan, A1 - Alex Orailoglu, PY - 2002 KW - null VL - 0 JA - Computer Design, International Conference on ER -

Baris Arslan, University of California at San Diego

Alex Orailoglu, University of California at San Diego

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICCD.2002.1106817

The exceedingly large size of fault dictionaries constitutes a fundamental obstacle to their usage. We outline a new method to reduce significantly the size of fault dictionaries. The proposed method partitions the test set and a combined signature is stored for each partition. The new approach aims to provide high diagnostic resolution with a small number of combined signatures. The experimental results show a considerable decrease in the storage requirement of fault dictionaries.

Citation:

Baris Arslan, Alex Orailoglu, "Fault Dictionary Size Reduction through Test Response Superposition," iccd, pp.480, 2002 IEEE International Conference on Computer Design (ICCD'02), 2002

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