A New Weight Set Generation Algorithm for Weighted Random Pattern Generation

I
ICCD
1999
1999 IEEE International Conference on Computer Design (ICCD'99)
Abstract - A New Weight Set Generation Algorithm for Weighted Random Pattern Generation

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	Similar Articles Articles by Hangkyu Lee Articles by Sungho Kang

1999 IEEE International Conference on Computer Design (ICCD'99)

Austin, Texas

October 10-October 13

ISBN: 0-7695-0406-X

	ASCII Text	x
	Hangkyu Lee, Sungho Kang, "A New Weight Set Generation Algorithm for Weighted Random Pattern Generation," Computer Design, International Conference on, pp. 160, 1999 IEEE International Conference on Computer Design (ICCD'99), 1999.

	BibTex	x
	@article{ 10.1109/ICCD.1999.808421, author = {Hangkyu Lee and Sungho Kang}, title = {A New Weight Set Generation Algorithm for Weighted Random Pattern Generation}, journal ={Computer Design, International Conference on}, volume = {0}, year = {1999}, issn = {1063-6404}, pages = {160}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICCD.1999.808421}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Computer Design, International Conference on TI - A New Weight Set Generation Algorithm for Weighted Random Pattern Generation SN - 1063-6404 SP EP A1 - Hangkyu Lee, A1 - Sungho Kang, PY - 1999 VL - 0 JA - Computer Design, International Conference on ER -

Hangkyu Lee, Yonsei University

Sungho Kang, Yonsei University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICCD.1999.808421

In weighted random pattern testing based on deterministic test patterns. If the number of the deterministic test patterns with a low sampling probability is reduced, the number of the weighted random patterns required to achieve a high fault coverage can be decreased. The weight set that makes the variance of sampling probabilities for deterministic test patterns very small, can reduce the number of the deterministic test patterns with a low sampling probability. In this paper, we present a new weight set generation algorithm which can generate high performance weight sets by reducing the variance of the sampling probabilities. Experimental results on ISCAS-85 benchmark circuits prove the effectiveness of the new weight set generation algorithm.

Citation:

Hangkyu Lee, Sungho Kang, "A New Weight Set Generation Algorithm for Weighted Random Pattern Generation," iccd, pp.160, 1999 IEEE International Conference on Computer Design (ICCD'99), 1999

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