Thomas M. Conte, Mary Ann Hirsch, Kishore N. Menezes, "Reducing State Loss For Effective Trace Sampling of Superscalar Processors," Computer Design, International Conference on, pp. 468, 1996 IEEE International Conference on Computer Design (ICCD'96), 1996.

@article{ 10.1109/ICCD.1996.563595,
author = {Thomas M. Conte and Mary Ann Hirsch and Kishore N. Menezes},
title = {Reducing State Loss For Effective Trace Sampling of Superscalar Processors},
journal ={Computer Design, International Conference on},
volume = {0},
year = {1996},
issn = {1063-6404},
pages = {468},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICCD.1996.563595},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Computer Design, International Conference on
TI - Reducing State Loss For Effective Trace Sampling of Superscalar Processors
SN - 1063-6404
SP
EP
A1 - Thomas M. Conte,
A1 - Mary Ann Hirsch,
A1 - Kishore N. Menezes,
PY - 1996
VL - 0
JA - Computer Design, International Conference on
ER -