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4th IEEE Southwest Symposium on Image Analysis and Interpretation
Using Deformable Models to Segment Complex Structures under Geometric Constraints
Austin, Texas
April 02-April 04
ISBN: 0-7695-0595-3
ASCII Text
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Christian Gout, Sylvie Vieira-Teste, "Using Deformable Models to Segment Complex Structures under Geometric Constraints," Image Analysis and Interpretation, IEEE Southwest Symposium on, pp. 101, 4th IEEE Southwest Symposium on Image Analysis and Interpretation, 2000.
 
 
BibTex
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@article{ 10.1109/IAI.2000.839580,
author = {Christian Gout and Sylvie Vieira-Teste},
title = {Using Deformable Models to Segment Complex Structures under Geometric Constraints},
journal ={Image Analysis and Interpretation, IEEE Southwest Symposium on},
volume = {0},
year = {2000},
isbn = {0-7695-0595-3},
pages = {101},
doi = {http://doi.ieeecomputersociety.org/10.1109/IAI.2000.839580},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Image Analysis and Interpretation, IEEE Southwest Symposium on
TI - Using Deformable Models to Segment Complex Structures under Geometric Constraints
SN - 0-7695-0595-3
SP
EP
A1 - Christian Gout,
A1 - Sylvie Vieira-Teste,
PY - 2000
VL - 0
JA - Image Analysis and Interpretation, IEEE Southwest Symposium on
ER -
 
Citation:
Christian Gout, Sylvie Vieira-Teste, "Using Deformable Models to Segment Complex Structures under Geometric Constraints," ssiai, pp.101, 4th IEEE Southwest Symposium on Image Analysis and Interpretation, 2000
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