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10th IEEE High Assurance Systems Engineering Symposium (HASE'07)
Dallas, Texas, USA
November 14-November 16
ISBN: 0-7695-3043-5
ASCII Text
x 
 
Miyoung Shin, Sunida Ratanothayanon, Amrit L. Goel, Raymond A. Paul, "Parsimonious?Classifiers?for?Software?Quality?Assessment," High-Assurance Systems Engineering, IEEE International Symposium on, pp. 411-412, 10th IEEE High Assurance Systems Engineering Symposium (HASE'07), 2007.
 
 
BibTex
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@article{ 10.1109/HASE.2007.75,
author = {Miyoung Shin and Sunida Ratanothayanon and Amrit L. Goel and Raymond A. Paul},
title = {Parsimonious?Classifiers?for?Software?Quality?Assessment},
journal ={High-Assurance Systems Engineering, IEEE International Symposium on},
volume = {0},
year = {2007},
issn = {1530-2059},
pages = {411-412},
doi = {http://doi.ieeecomputersociety.org/10.1109/HASE.2007.75},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - High-Assurance Systems Engineering, IEEE International Symposium on
TI - Parsimonious?Classifiers?for?Software?Quality?Assessment
SN - 1530-2059
SP411
EP412
A1 - Miyoung Shin,
A1 - Sunida Ratanothayanon,
A1 - Amrit L. Goel,
A1 - Raymond A. Paul,
PY - 2007
KW - ?Software quality
KW - Software metrics
KW - Classification
KW - Parsimonious classifiers
VL - 0
JA - High-Assurance Systems Engineering, IEEE International Symposium on
ER -
 
Modeling?to?predict faultproneness of software modules is an important area?of research in software engineering. Most such models employ a?large number of basic and derived metrics as predictors. This paper presents modeling?results based on only?two?metrics, lines of code and cyclomatic complexity, using?radial basis functions with Gaussian kernels as classifiers. Results from two?NASA systems are presented and analyzed.
Index Terms:
?Software quality, Software metrics, Classification, Parsimonious classifiers
Citation:
Miyoung Shin, Sunida Ratanothayanon, Amrit L. Goel, Raymond A. Paul, "Parsimonious?Classifiers?for?Software?Quality?Assessment," hase, pp.411-412, 10th IEEE High Assurance Systems Engineering Symposium (HASE'07), 2007
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