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10th IEEE High Assurance Systems Engineering Symposium (HASE'07)
Dallas, Texas, USA
November 14-November 16
ISBN: 0-7695-3043-5
We study recent developments in quantum computing (QC) testing and fault tolerance (FT) techniques and discuss several attempts to formalize quantum logic fault models. We illustrate the inherent need for fault tolerance in QC due to the decoherence problem. Further, we examine several ideas regarding random testing and examine the viability of built-insystem-test (BIST) in future QC circuits.
Citation:
David Y. Feinstein, V.S.S. Nair, Mitchell A. Thornton, "Advances in Quantum Computing Fault Tolerance and Testing," hase, pp.369-370, 10th IEEE High Assurance Systems Engineering Symposium (HASE'07), 2007
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