The Reliability of FPGA Circuit Designs in the Presence of Radiation Induced Configuration Upsets

F
FCCM
2003
11th Annual IEEE Symposium on Field-Programmable Custom Computing Machines
Abstract - The Reliability of FPGA Circuit Designs in the Presence of Radiation Induced Configuration Upsets

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11th Annual IEEE Symposium on Field-Programmable Custom Computing Machines

Napa, California

April 09-April 11

ISBN: 0-7695-1979-2

	ASCII Text	x
	Michael Wirthlin, Eric Johnson, Nathan Rollins, Michael Caffrey, Paul Graham, "The Reliability of FPGA Circuit Designs in the Presence of Radiation Induced Configuration Upsets," Field-Programmable Custom Computing Machines, Annual IEEE Symposium on, pp. 133, 11th Annual IEEE Symposium on Field-Programmable Custom Computing Machines, 2003.

	BibTex	x
	@article{ 10.1109/FPGA.2003.1227249, author = {Michael Wirthlin and Eric Johnson and Nathan Rollins and Michael Caffrey and Paul Graham}, title = {The Reliability of FPGA Circuit Designs in the Presence of Radiation Induced Configuration Upsets}, journal ={Field-Programmable Custom Computing Machines, Annual IEEE Symposium on}, volume = {0}, year = {2003}, issn = {1082-3409}, pages = {133}, doi = {http://doi.ieeecomputersociety.org/10.1109/FPGA.2003.1227249}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Field-Programmable Custom Computing Machines, Annual IEEE Symposium on TI - The Reliability of FPGA Circuit Designs in the Presence of Radiation Induced Configuration Upsets SN - 1082-3409 SP EP A1 - Michael Wirthlin, A1 - Eric Johnson, A1 - Nathan Rollins, A1 - Michael Caffrey, A1 - Paul Graham, PY - 2003 KW - null VL - 0 JA - Field-Programmable Custom Computing Machines, Annual IEEE Symposium on ER -

Michael Wirthlin, Brigham Young University, Provo, UT

Eric Johnson, Brigham Young University, Provo, UT

Nathan Rollins, Brigham Young University, Provo, UT

Michael Caffrey, Los Alamos National Laboratory, Los Alamos, NM

Paul Graham, Los Alamos National Laboratory, Los Alamos, NM

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/FPGA.2003.1227249

FPGAs are an appealing solution for space-based remote sensing applications. However, in a low-earth orbit, FPGAs are susceptible to Single-Event Upsets (SEUs). In an effort to understand the effects of SEUs, an SEU simulator based on the SLAAC-1V computing board has been developed. This simulator artifically upsets the configuration memory of an FPGA and measures its impact on FPGA designs. The accuracy of this simulation environment has been verified using ground-based radiation testing. This simulation tool is being used to characterize the reliability of SEU mitigation techniques for FPGAs.

Citation:

Michael Wirthlin, Eric Johnson, Nathan Rollins, Michael Caffrey, Paul Graham, "The Reliability of FPGA Circuit Designs in the Presence of Radiation Induced Configuration Upsets," fccm, pp.133, 11th Annual IEEE Symposium on Field-Programmable Custom Computing Machines, 2003

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