12th Annual IEEE Symposium on Field-Programmable Custom Computing Machines (FCCM'04) Defect and Fault Tolerance of Reconfigurable Molecular Computing Napa, California April 20-April 23 ISBN: 0-7695-2230-0
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/FCCM.2004.26
Fault detection and diagnosis techniques that are essential for defect tolerance, fault tolerance and self-repair of reconfigurable molecular computing systems are discussed. These techniques enable robust molecular computing system design protected from manufacturing defects and run-time errors in the underlying hardware. In this paper, we demonstrate how test and diagnosis techniques originally developed for FPGAs can be used in the context of molecular computing.
Citation:
Mehdi B. Tahoori, Subhasish Mitra, "Defect and Fault Tolerance of Reconfigurable Molecular Computing," fccm, pp.176-185, 12th Annual IEEE Symposium on Field-Programmable Custom Computing Machines (FCCM'04), 2004 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||