loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Proceedings of The 26th EUROMICRO Conference (EUROMICRO'00) Volume I-Volume 1
Extensive Testing of Floating Point Unit
Maastricht, The Netherlands
September 05-September 07
ISBN: 0-7695-0780-8
ASCII Text
x 
 
Janusz Sosnowski, Tomasz Bech, "Extensive Testing of Floating Point Unit," EUROMICRO Conference, vol. 1, pp. 1180, Proceedings of The 26th EUROMICRO Conference (EUROMICRO'00) Volume I-Volume 1, 2000.
 
 
BibTex
x
 
@article{ 10.1109/EURMIC.2000.874631,
author = {Janusz Sosnowski and Tomasz Bech},
title = {Extensive Testing of Floating Point Unit},
journal ={EUROMICRO Conference},
volume = {1},
year = {2000},
isbn = {0-7695-0780-8},
pages = {1180},
doi = {http://doi.ieeecomputersociety.org/10.1109/EURMIC.2000.874631},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - EUROMICRO Conference
TI - Extensive Testing of Floating Point Unit
SN - 0-7695-0780-8
SP
EP
A1 - Janusz Sosnowski,
A1 - Tomasz Bech,
PY - 2000
VL - 1
JA - EUROMICRO Conference
ER -
 
Janusz Sosnowski, Warsaw University of Technology
Tomasz Bech, Warsaw University of Technology
The paper addresses the problem of developing test programs for IEEE754 and Intel x87 compliant floating-point units (FPUs). A balanced mixture of pseudorandom, fault and application oriented instruction sequences assures exhaustive testing. Special tools have been used to manage test monitoring and optimize fault coverage. Their usefulness was illustrated with experimental results. Some data related to the cost (in time and RAM space) of developed tests are presented.
Citation:
Janusz Sosnowski, Tomasz Bech, "Extensive Testing of Floating Point Unit," euromicro, vol. 1, pp.1180, Proceedings of The 26th EUROMICRO Conference (EUROMICRO'00) Volume I-Volume 1, 2000
Usage of this product signifies your acceptance of the Terms of Use.