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12th IEEE European Test Symposium (ETS'07)
Embedded Tutorial on Low Power Test
Freiburg, Germany
May 20-May 24
ISBN: 0-7695-2827-9
ASCII Text
x 
 
Nicola Nicolici, Xiaoqing Wen, "Embedded Tutorial on Low Power Test," European Test Symposium, IEEE, pp. 202-210, 12th IEEE European Test Symposium (ETS'07), 2007.
 
 
BibTex
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@article{ 10.1109/ETS.2007.22,
author = {Nicola Nicolici and Xiaoqing Wen},
title = {Embedded Tutorial on Low Power Test},
journal ={European Test Symposium, IEEE},
volume = {0},
year = {2007},
issn = {1530-1877},
pages = {202-210},
doi = {http://doi.ieeecomputersociety.org/10.1109/ETS.2007.22},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - European Test Symposium, IEEE
TI - Embedded Tutorial on Low Power Test
SN - 1530-1877
SP202
EP210
A1 - Nicola Nicolici,
A1 - Xiaoqing Wen,
PY - 2007
KW - null
VL - 0
JA - European Test Symposium, IEEE
ER -
 
Nicola Nicolici, McMaster University, Canada
Xiaoqing Wen, Kyushu Institute of Technology, Japan
Excessive power during test affects the reliability of digital integrated circuits, test throughput and manufacturing yield. Numerous low power test methods have been investigated over the past decade and new power-aware automatic test pattern generation, design-for-test and test planning techniques have emerged. This embedded tutorial introduces the topic of low power test and it overviews the basic techniques and some recent advancements in this field.
Citation:
Nicola Nicolici, Xiaoqing Wen, "Embedded Tutorial on Low Power Test," ets, pp.202-210, 12th IEEE European Test Symposium (ETS'07), 2007
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