Eleventh IEEE European Test Symposium (ETS'06) Fault Collapsing for Transition Faults Using Extended Transition Faults Southampton, United Kingdom May 21-May 21 ISBN: 0-7695-2566-0
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ETS.2006.22
e present a fault collapsing procedure for transition faults based on fault dominance relations. The effectiveness of the procedure is enhanced by introducing what we call extended transition faults. A standard transition fault involves a single line and a transition. A transition fault from the value a to the value a' on a line g is represented as g =a\tog =a' . An extended transition fault involves two different lines with arbitrary values, and it is represented as g_1=a_1\tog2=a'_2. We demonstrate the importance of extended transition faults in fault collapsing, and describe two fault collapsing procedures. We consider the effects of fault collapsing on test generation.
Citation:
Irith Pomeranz, Sudhakar M. Reddy, "Fault Collapsing for Transition Faults Using Extended Transition Faults," ets, pp.173-178, Eleventh IEEE European Test Symposium (ETS'06), 2006 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||