2005 NASA/DoD Conference on Evolvable Hardware (EH'05) Survivability of Embryonic Memories: Analysis and Design Principles Washington DC, June 29-July 01 ISBN: 0-7695-2399-4
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/EH.2005.44
This paper proposes an original approach to the reliability analysis for Embryonics [4], by introducing the accuracy threshold measure, borrowed from fault-tolerant quantum computing theory, as one of the main parameters for our qualitative assessment. The validity of this technique is proven by comparison with the classical reliability results; furthermore, it brings new perspectives on designing reliable embryonic memory structures at both the molecular and the cellular levels. Appropriate design principles are provided on both information encoding (concatenated codes) and storage (fault tolerant memory structures).
Citation:
Lucian Prodan, Mihai Udrescu, Mircea Vladutiu, "Survivability of Embryonic Memories: Analysis and Design Principles," eh, pp.280-289, 2005 NASA/DoD Conference on Evolvable Hardware (EH'05), 2005 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||