Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers

E
EH
2003
2003 NASA/DoD Conference on Evolvable Hardware (EH'03)
Abstract - Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers

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	Similar Articles Articles by Luka?s Sekanina Articles by Richard Ru?zi?cka

2003 NASA/DoD Conference on Evolvable Hardware (EH'03)

Chicago, Illinois

July 09-July 11

ISBN: 0-7695-1977-6

	ASCII Text	x
	Luka?s Sekanina, Richard Ru?zi?cka, "Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers," Evolvable Hardware, NASA/DoD Conference on, pp. 135, 2003 NASA/DoD Conference on Evolvable Hardware (EH'03), 2003.

	BibTex	x
	@article{ 10.1109/EH.2003.1217658, author = {Luka?s Sekanina and Richard Ru?zi?cka}, title = {Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers}, journal ={Evolvable Hardware, NASA/DoD Conference on}, volume = {0}, year = {2003}, isbn = {0-7695-1977-6}, pages = {135}, doi = {http://doi.ieeecomputersociety.org/10.1109/EH.2003.1217658}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Evolvable Hardware, NASA/DoD Conference on TI - Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers SN - 0-7695-1977-6 SP EP A1 - Luka?s Sekanina, A1 - Richard Ru?zi?cka, PY - 2003 KW - null VL - 0 JA - Evolvable Hardware, NASA/DoD Conference on ER -

Luka?s Sekanina, Faculty of Information Technology, Brno University of Technology

Richard Ru?zi?cka, Faculty of Information Technology, Brno University of Technology

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/EH.2003.1217658

The paper deals with a class of image filters in which the evolutionary approach consistently produces excellent and innovative results. Furthermore, a method is proposed that leads to the automatic design of easily testable circuits. In particular we evolved ?salt and pepper? noise filters, random shot noise filters, Gaussian noise filters, uniform random noise filters, and edge detectors.

Citation:

Luka?s Sekanina, Richard Ru?zi?cka, "Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers," eh, pp.135, 2003 NASA/DoD Conference on Evolvable Hardware (EH'03), 2003

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