The Test Vector Problem and Limitations to Evolving Digital Circuits

E
EH
2000
The Second NASA/DoD Workshop on Evolvable Hardware (EH'00)
Abstract - The Test Vector Problem and Limitations to Evolving Digital Circuits

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The Second NASA/DoD Workshop on Evolvable Hardware (EH'00)

Palo Alto, California

July 13-July 15

ISBN: 0-7695-0762-X

	ASCII Text	x
	Kosuke Imamura, James A. Foster, Axel W. Krings, "The Test Vector Problem and Limitations to Evolving Digital Circuits," Evolvable Hardware, NASA/DoD Conference on, pp. 75, The Second NASA/DoD Workshop on Evolvable Hardware (EH'00), 2000.

	BibTex	x
	@article{ 10.1109/EH.2000.869344, author = {Kosuke Imamura and James A. Foster and Axel W. Krings}, title = {The Test Vector Problem and Limitations to Evolving Digital Circuits}, journal ={Evolvable Hardware, NASA/DoD Conference on}, volume = {0}, year = {2000}, isbn = {0-7695-0762-X}, pages = {75}, doi = {http://doi.ieeecomputersociety.org/10.1109/EH.2000.869344}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Evolvable Hardware, NASA/DoD Conference on TI - The Test Vector Problem and Limitations to Evolving Digital Circuits SN - 0-7695-0762-X SP EP A1 - Kosuke Imamura, A1 - James A. Foster, A1 - Axel W. Krings, PY - 2000 VL - 0 JA - Evolvable Hardware, NASA/DoD Conference on ER -

Kosuke Imamura, University of Idaho

James A. Foster, University of Idaho

Axel W. Krings, University of Idaho

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/EH.2000.869344

How do we know the correctness of an evolved circuit? While Evolutionary Hardware is exhibiting its effectiveness, we argue that it is very difficult to design a large-scale digital circuit by conventional evolutionary techniques alone, if we are using a subset of the entire truth table for fitness evaluation. The test vector generation problem for testing VLSI (Very Large Scale Integration) suggests that there is no efficient way to determine training set, which assures full correctness of an evolved circuit.

Citation:

Kosuke Imamura, James A. Foster, Axel W. Krings, "The Test Vector Problem and Limitations to Evolving Digital Circuits," eh, pp.75, The Second NASA/DoD Workshop on Evolvable Hardware (EH'00), 2000

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