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The First NASA/DOD Workshop on Evolvable Hardware
Inherent Qualities of Circuits Designed by Artificial Evolution: A Preliminary Study of Populational Fault Tolerance
Pasadena, California
July 19-July 21
ISBN: 0-7695-0256-3
ASCII Text
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Paul Layzell, "Inherent Qualities of Circuits Designed by Artificial Evolution: A Preliminary Study of Populational Fault Tolerance," Evolvable Hardware, NASA/DoD Conference on, pp. 85, The First NASA/DOD Workshop on Evolvable Hardware, 1999.
 
 
BibTex
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@article{ 10.1109/EH.1999.785438,
author = {Paul Layzell},
title = {Inherent Qualities of Circuits Designed by Artificial Evolution: A Preliminary Study of Populational Fault Tolerance},
journal ={Evolvable Hardware, NASA/DoD Conference on},
volume = {0},
year = {1999},
isbn = {0-7695-0256-3},
pages = {85},
doi = {http://doi.ieeecomputersociety.org/10.1109/EH.1999.785438},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Evolvable Hardware, NASA/DoD Conference on
TI - Inherent Qualities of Circuits Designed by Artificial Evolution: A Preliminary Study of Populational Fault Tolerance
SN - 0-7695-0256-3
SP
EP
A1 - Paul Layzell,
PY - 1999
VL - 0
JA - Evolvable Hardware, NASA/DoD Conference on
ER -
 
Paul Layzell, University of Sussex
An investigation of the likelihood of evolved circuit populations to contain an individual robust to a fault which renders the previously best individual useless.
Citation:
Paul Layzell, "Inherent Qualities of Circuits Designed by Artificial Evolution: A Preliminary Study of Populational Fault Tolerance," eh, pp.85, The First NASA/DOD Workshop on Evolvable Hardware, 1999
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