SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System

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	Similar Articles Articles by Josef Strnadel Articles by Zdenek Kotasek

13th Annual IEEE International Symposium and Workshop on Engineering of Computer Based Systems (ECBS'06)

Postdam, Germany

March 27-March 30

ISBN: 0-7695-2546-6

	ASCII Text	x
	Josef Strnadel, Zdenek Kotasek, "SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System," Engineering of Computer-Based Systems, IEEE International Conference on the, pp. 497-498, 13th Annual IEEE International Symposium and Workshop on Engineering of Computer Based Systems (ECBS'06), 2006.

	BibTex	x
	@article{ 10.1109/ECBS.2006.65, author = {Josef Strnadel and Zdenek Kotasek}, title = {SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System}, journal ={Engineering of Computer-Based Systems, IEEE International Conference on the}, volume = {0}, year = {2006}, isbn = {0-7695-2546-6}, pages = {497-498}, doi = {http://doi.ieeecomputersociety.org/10.1109/ECBS.2006.65}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Engineering of Computer-Based Systems, IEEE International Conference on the TI - SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System SN - 0-7695-2546-6 SP497 EP498 A1 - Josef Strnadel, A1 - Zdenek Kotasek, PY - 2006 KW - null VL - 0 JA - Engineering of Computer-Based Systems, IEEE International Conference on the ER -

Josef Strnadel, brno University of Technology

Zdenek Kotasek, brno University of Technology

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ECBS.2006.65

In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to illustrate relation between design and diagnostic parameters of embedded system.

Citation:

Josef Strnadel, Zdenek Kotasek, "SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System," ecbs, pp.497-498, 13th Annual IEEE International Symposium and Workshop on Engineering of Computer Based Systems (ECBS'06), 2006

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