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13th Annual IEEE International Symposium and Workshop on Engineering of Computer Based Systems (ECBS'06)
SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System
Postdam, Germany
March 27-March 30
ISBN: 0-7695-2546-6
ASCII Text
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Josef Strnadel, Zdenek Kotasek, "SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System," Engineering of Computer-Based Systems, IEEE International Conference on the, pp. 497-498, 13th Annual IEEE International Symposium and Workshop on Engineering of Computer Based Systems (ECBS'06), 2006.
 
 
BibTex
x
 
@article{ 10.1109/ECBS.2006.65,
author = {Josef Strnadel and Zdenek Kotasek},
title = {SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System},
journal ={Engineering of Computer-Based Systems, IEEE International Conference on the},
volume = {0},
year = {2006},
isbn = {0-7695-2546-6},
pages = {497-498},
doi = {http://doi.ieeecomputersociety.org/10.1109/ECBS.2006.65},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Engineering of Computer-Based Systems, IEEE International Conference on the
TI - SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System
SN - 0-7695-2546-6
SP497
EP498
A1 - Josef Strnadel,
A1 - Zdenek Kotasek,
PY - 2006
KW - null
VL - 0
JA - Engineering of Computer-Based Systems, IEEE International Conference on the
ER -
 
Josef Strnadel, brno University of Technology
Zdenek Kotasek, brno University of Technology
In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to illustrate relation between design and diagnostic parameters of embedded system.
Citation:
Josef Strnadel, Zdenek Kotasek, "SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System," ecbs, pp.497-498, 13th Annual IEEE International Symposium and Workshop on Engineering of Computer Based Systems (ECBS'06), 2006
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