International Conference on Dependable Systems and Networks (DSN'02) Test and Development Process Retrospective — A Case Study using ODC Triggers Washington, D.C., USA June 23-June 26 ISBN: 0-7695-1597-5
We present a case study of a product development retrospective analysis conducted to gain an understanding of the test and development process effectiveness. Orthogonal Defect Classification (ODC) is used as an analysis method to gain insight beyond what classical qualitative analysis would yield for the probable cause of delays during test.
Citation:
Ram Chillarege, Kothanda Ram Prasad, "Test and Development Process Retrospective — A Case Study using ODC Triggers," dsn, pp.669, International Conference on Dependable Systems and Networks (DSN'02), 2002 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||