Zhiyuan He, Zebo Peng, Petru Eles, "Thermal-Aware Test Scheduling for Core-Based SoC in an Abort-on-First-Fail Test Environment," Digital Systems Design, Euromicro Symposium on, pp. 239-246, 2009 12th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, 2009.

@article{ 10.1109/DSD.2009.136,
author = {Zhiyuan He and Zebo Peng and Petru Eles},
title = {Thermal-Aware Test Scheduling for Core-Based SoC in an Abort-on-First-Fail Test Environment},
journal ={Digital Systems Design, Euromicro Symposium on},
volume = {0},
year = {2009},
isbn = {978-0-7695-3782-5},
pages = {239-246},
doi = {http://doi.ieeecomputersociety.org/10.1109/DSD.2009.136},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Digital Systems Design, Euromicro Symposium on
TI - Thermal-Aware Test Scheduling for Core-Based SoC in an Abort-on-First-Fail Test Environment
SN - 978-0-7695-3782-5
SP239
EP246
A1 - Zhiyuan He,
A1 - Zebo Peng,
A1 - Petru Eles,
PY - 2009
KW - system-on-chip test
KW - test scheduling
KW - thermal-aware test
KW - abort-on-first-fail
VL - 0
JA - Digital Systems Design, Euromicro Symposium on
ER -