As the device sizes are shrinking, the next generation combinational logic will also become equally susceptible to soft errors as the memory elements. In this paper, we propose a novel technique to minimize the impact of soft errors in domino logic by using complementary pass transistor devices and additional weak keeper to selectively isolate the logic gates struck by single event upsets (SEUs). Experimental analysis shows that this technique achieves soft error suppression with no extra power consumption and modest area (2.6%) and delay (13.6%) overhead.