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20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05)
Should Illinois-Scan Based Architectures be Centralized or Distributed?
Monterey, California
October 03-October 05
ISBN: 0-7695-2464-8
ASCII Text
x 
 
Ahmad Al-Yamani, Narendra Devta-Prasanna, Arun Gunda, "Should Illinois-Scan Based Architectures be Centralized or Distributed?," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 406-414, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005.
 
 
BibTex
x
 
@article{ 10.1109/DFTVS.2005.59,
author = {Ahmad Al-Yamani and Narendra Devta-Prasanna and Arun Gunda},
title = {Should Illinois-Scan Based Architectures be Centralized or Distributed?},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2005},
isbn = {0-7695-2464-8},
pages = {406-414},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2005.59},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - Should Illinois-Scan Based Architectures be Centralized or Distributed?
SN - 0-7695-2464-8
SP406
EP414
A1 - Ahmad Al-Yamani,
A1 - Narendra Devta-Prasanna,
A1 - Arun Gunda,
PY - 2005
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
Ahmad Al-Yamani, KFUPM, Dhahran, Saudi Arabia
Narendra Devta-Prasanna, Univ. of Iowa, Iowa
Arun Gunda, LSI Logic Corp.

This paper presents analysis of the trade off between hardware overhead, runtime, and test data volume when implementing Systematic Scan Reconfiguration using centralized and distributed architectures of the Segmented Addressable Scan, which is an Illinois-Scan based architecture. The results show that the centralized scheme offers better data volume compression, similar ATPG runtime results and lower hardware overhead. The cost with the centralized scheme is in the routing congestion.

Citation:
Ahmad Al-Yamani, Narendra Devta-Prasanna, Arun Gunda, "Should Illinois-Scan Based Architectures be Centralized or Distributed?," dft, pp.406-414, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005
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