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20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05)
On the Modeling and Analysis of Jitter in ATE Using Matlab
Monterey, California
October 03-October 05
ISBN: 0-7695-2464-8
ASCII Text
x 
 
Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio Lombardi, "On the Modeling and Analysis of Jitter in ATE Using Matlab," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 285-293, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005.
 
 
BibTex
x
 
@article{ 10.1109/DFTVS.2005.52,
author = {Kyung Ki Kim and Jing Huang and Yong-Bin Kim and Fabrizio Lombardi},
title = {On the Modeling and Analysis of Jitter in ATE Using Matlab},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2005},
isbn = {0-7695-2464-8},
pages = {285-293},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2005.52},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - On the Modeling and Analysis of Jitter in ATE Using Matlab
SN - 0-7695-2464-8
SP285
EP293
A1 - Kyung Ki Kim,
A1 - Jing Huang,
A1 - Yong-Bin Kim,
A1 - Fabrizio Lombardi,
PY - 2005
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
Kyung Ki Kim, Northeastern University, Boston
Jing Huang, Northeastern University, Boston
Yong-Bin Kim, Northeastern University, Boston
Fabrizio Lombardi, Northeastern University, Boston

This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in Automatic Test Equipment (ATE). The separate components are analyzed individually and then combined using Matlab. The Matlab simulation shows how jitter components combine and how the total jitter depends on the jitter injection sequence. The relationship among jitter components is presented and the superposition of the jitter components is verified. This new technique gives test engineers an insight into how the jitter components interact.

Citation:
Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio Lombardi, "On the Modeling and Analysis of Jitter in ATE Using Matlab," dft, pp.285-293, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005
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