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20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05)
Modeling QCA Defects at Molecular-level in Combinational Circuits
Monterey, California
October 03-October 05
ISBN: 0-7695-2464-8
ASCII Text
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Mariam Momenzadeh, Marco Ottavi, Fabrizio Lombardi, "Modeling QCA Defects at Molecular-level in Combinational Circuits," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 208-216, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005.
 
 
BibTex
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@article{ 10.1109/DFTVS.2005.46,
author = {Mariam Momenzadeh and Marco Ottavi and Fabrizio Lombardi},
title = {Modeling QCA Defects at Molecular-level in Combinational Circuits},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2005},
isbn = {0-7695-2464-8},
pages = {208-216},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2005.46},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - Modeling QCA Defects at Molecular-level in Combinational Circuits
SN - 0-7695-2464-8
SP208
EP216
A1 - Mariam Momenzadeh,
A1 - Marco Ottavi,
A1 - Fabrizio Lombardi,
PY - 2005
KW - fault model
KW - defect tolerance
KW - QCA
KW - emerging technology
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
Mariam Momenzadeh, Northeastern University, Boston
Marco Ottavi, Northeastern University, Boston
Fabrizio Lombardi, Northeastern University, Boston

This paper analyzes the deposition defects in devices and circuits made of Quantum-dot Cellular Automata (QCA) for molecular implementation. Differently from metal-based QCA, in this type of implementation a defect may occur due to the erroneous deposition of cells (made of molecules) on a substrate, i.e. no cell, or an additional cell is placed either near, or within the layout configuration of a QCA device. The effects of an erroneous cell deposition defect are analyzed by considering the induced functional faults for different QCA devices, such as the majority voter, the inverter and various wire configurations (straight, L-shape, coplanar crossing and fanout). Extensive simulation results are provided. As an example, testing of an EXOR circuit is analyzed in detail.

Index Terms:
fault model, defect tolerance, QCA, emerging technology
Citation:
Mariam Momenzadeh, Marco Ottavi, Fabrizio Lombardi, "Modeling QCA Defects at Molecular-level in Combinational Circuits," dft, pp.208-216, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005
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