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20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05)
Defect Tolerance for Molecular Electronics-Based NanoFabrics Using Built-In Self-Test Procedure
Monterey, California
October 03-October 05
ISBN: 0-7695-2464-8
ASCII Text
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Mohammad Tehranipoor, "Defect Tolerance for Molecular Electronics-Based NanoFabrics Using Built-In Self-Test Procedure," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 305-313, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005.
 
 
BibTex
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@article{ 10.1109/DFTVS.2005.27,
author = {Mohammad Tehranipoor},
title = {Defect Tolerance for Molecular Electronics-Based NanoFabrics Using Built-In Self-Test Procedure},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2005},
isbn = {0-7695-2464-8},
pages = {305-313},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2005.27},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - Defect Tolerance for Molecular Electronics-Based NanoFabrics Using Built-In Self-Test Procedure
SN - 0-7695-2464-8
SP305
EP313
A1 - Mohammad Tehranipoor,
PY - 2005
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
Mohammad Tehranipoor, University of Maryland, Baltimore

A BIST procedure is proposed for testing and fault tolerance of molecular electronics-based nanoFabrics. The nanoFabrics are assumed to include up to 1010 gates; this requires new test strategies that can efficiently test and diagnose the nanoFabric in a reasonable time. Our BIST procedure utilizes nanoFabric?s components as test pattern generator and response analyzer. The proposed technique tests the components in parallel with a low number of test configurations reducing the test time significantly. Due to high defect density of nanoFabrics, a diagnostic procedure needs to be done to achieve a high recovery. A defect database is created to be used by compilers during configuring the nanoFabric to avoid defective components. This results in a reliable system constructed using unreliable components.

Citation:
Mohammad Tehranipoor, "Defect Tolerance for Molecular Electronics-Based NanoFabrics Using Built-In Self-Test Procedure," dft, pp.305-313, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005
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