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20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05)
Data Dependent Jitter (DDJ) Characterization Methodology
Monterey, California
October 03-October 05
ISBN: 0-7695-2464-8
ASCII Text
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Kyung Ki Kim, Yong-Bin Kim, Fabrizio Lombardi, "Data Dependent Jitter (DDJ) Characterization Methodology," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 294-304, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005.
 
 
BibTex
x
 
@article{ 10.1109/DFTVS.2005.25,
author = {Kyung Ki Kim and Yong-Bin Kim and Fabrizio Lombardi},
title = {Data Dependent Jitter (DDJ) Characterization Methodology},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2005},
isbn = {0-7695-2464-8},
pages = {294-304},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2005.25},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - Data Dependent Jitter (DDJ) Characterization Methodology
SN - 0-7695-2464-8
SP294
EP304
A1 - Kyung Ki Kim,
A1 - Yong-Bin Kim,
A1 - Fabrizio Lombardi,
PY - 2005
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
Kyung Ki Kim, Northeastern University, Boston
Yong-Bin Kim, Northeastern University, Boston
Fabrizio Lombardi, Northeastern University, Boston

A new jitter model is developed using Matlab and Spice to analyze Data Dependent Jitter (DDJ) in serial data integrated circuits. The simulation results show that DDJ is dependent on the data pattern, data rate, and data slew as well as frequency bandwidth, impedance mismatch, and loss of the data path of integrated circuits. This paper presents the effect of the DDJ on other jitter subcomponents, which is essential to analysis and characterization of DDJ.

Citation:
Kyung Ki Kim, Yong-Bin Kim, Fabrizio Lombardi, "Data Dependent Jitter (DDJ) Characterization Methodology," dft, pp.294-304, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005
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