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20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05)
A Self Checking Reed Solomon Encoder: Design and Analysis
Monterey, California
October 03-October 05
ISBN: 0-7695-2464-8
ASCII Text
x 
 
G.C. Cardarilli, S. Pontarelli, M. Re, A. Salsano, "A Self Checking Reed Solomon Encoder: Design and Analysis," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 111-119, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005.
 
 
BibTex
x
 
@article{ 10.1109/DFTVS.2005.13,
author = {G.C. Cardarilli and S. Pontarelli and M. Re and A. Salsano},
title = {A Self Checking Reed Solomon Encoder: Design and Analysis},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2005},
isbn = {0-7695-2464-8},
pages = {111-119},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2005.13},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - A Self Checking Reed Solomon Encoder: Design and Analysis
SN - 0-7695-2464-8
SP111
EP119
A1 - G.C. Cardarilli,
A1 - S. Pontarelli,
A1 - M. Re,
A1 - A. Salsano,
PY - 2005
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
G.C. Cardarilli, University of Rome
S. Pontarelli, University of Rome
M. Re, University of Rome
A. Salsano, University of Rome

Reed Solomon codes are widely used to identify and correct data errors in transmission and storage systems. Due to the vital importance of these blocks, a very important research topic is the study of the effects of faults on their behavior. The presented architecture exploits some properties of the arithmetic operations on GF(2n) Galois Field, related to the parity of the binary representation of the elements of the field. The encoder has been mapped on an SRAM based FPGA, the self-checking property has been analyzed using a SEU fault model and the performances in terms of area and delay overhead are presented.

Citation:
G.C. Cardarilli, S. Pontarelli, M. Re, A. Salsano, "A Self Checking Reed Solomon Encoder: Design and Analysis," dft, pp.111-119, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005
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