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20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05)
Monterey, California
October 03-October 05
ISBN: 0-7695-2464-8
ASCII Text
x 
 
"20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Copyright," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. iv, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005.
 
 
BibTex
x
 
@article{ 10.1109/DFTVS.2005.1,
author = {},
title = {20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Copyright},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2005},
isbn = {0-7695-2464-8},
pages = {iv},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2005.1},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Copyright
SN - 0-7695-2464-8
SP
EP
PY - 2005
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
Citation:
"20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Copyright," dft, pp.iv, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005
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