Heterogeneous Redundancy for Fault and Defect Tolerance with Complexity Independent Area Overhead

D
DFT
2003
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03)
Abstract - Heterogeneous Redundancy for Fault and Defect Tolerance with Complexity Independent Area Overhead

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18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03)

Boston, Massachusetts

November 03-November 05

ISBN: 0-7695-2042-1

	ASCII Text	x
	Vinu Vijay Kumar, John Lach, "Heterogeneous Redundancy for Fault and Defect Tolerance with Complexity Independent Area Overhead," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 571, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003.

	BibTex	x
	@article{ 10.1109/DFTVS.2003.1250157, author = {Vinu Vijay Kumar and John Lach}, title = {Heterogeneous Redundancy for Fault and Defect Tolerance with Complexity Independent Area Overhead}, journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on}, volume = {0}, year = {2003}, issn = {1063-6722}, pages = {571}, doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250157}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on TI - Heterogeneous Redundancy for Fault and Defect Tolerance with Complexity Independent Area Overhead SN - 1063-6722 SP EP A1 - Vinu Vijay Kumar, A1 - John Lach, PY - 2003 KW - null VL - 0 JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on ER -

Vinu Vijay Kumar, University of Virginia

John Lach, University of Virginia

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250157

The continuous increase in digital system complexity is raising the area cost of redundancy-based fault and defect tolerance. This paper introduces a technique for heterogeneous redundancy in control path and datapath circuitry that provides high reliability with area overhead that is independent of system complexity. Small amounts of circuit-specific reconfigurable logic are finely integrated with fixed-logic circuitry to provide fine-grained heterogeneous fault and defect tolerance. Results reveal that the technique is effective for a variety of circuits, providing high reliability with a constant magnitude area overhead that is independent of system complexity.

Citation:

Vinu Vijay Kumar, John Lach, "Heterogeneous Redundancy for Fault and Defect Tolerance with Complexity Independent Area Overhead," dft, pp.571, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003

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