18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03) Fault Tolerant Multi-Layer Neural Networks with GA Training Boston, Massachusetts November 03-November 05 ISBN: 0-7695-2042-1
This paper addresses fault tolerant architecture of multi-layer neural networks with a genetic algorithm scheme. For large scale neural networks implemented in single chip or silicon wafer, it is necessary to develop self-recovery mechanisms that can automatically recover faults without a host computer. In this paper, we propose a fault tolerant multi-layer neural networks employing both hardware redundancy and weight retraining in order to realize self-recovering neural networks. The main advantages of our architecture are low hardware cost for adding redundant neurons and fast training by a genetic algorithm implemented in hardware. A prototype system is implemented on a field programmable gate array to show the possibility of self-recovering neural networks.
Citation:
Eiko Sugawara, Masaru Fukushi, Susumu Horiguchi, "Fault Tolerant Multi-Layer Neural Networks with GA Training," dft, pp.328, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||