Thermal Management of High Performance Microprocessors

D
DFT
2003
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03)
Abstract - Thermal Management of High Performance Microprocessors

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18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03)

Boston, Massachusetts

November 03-November 05

ISBN: 0-7695-2042-1

	ASCII Text	x
	Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi, "Thermal Management of High Performance Microprocessors," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 313, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003.

	BibTex	x
	@article{ 10.1109/DFTVS.2003.1250126, author = {Arman Vassighi and Oleg Semenov and Manoj Sachdev and Ali Keshavarzi}, title = {Thermal Management of High Performance Microprocessors}, journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on}, volume = {0}, year = {2003}, issn = {1063-6722}, pages = {313}, doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250126}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on TI - Thermal Management of High Performance Microprocessors SN - 1063-6722 SP EP A1 - Arman Vassighi, A1 - Oleg Semenov, A1 - Manoj Sachdev, A1 - Ali Keshavarzi, PY - 2003 KW - null VL - 0 JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on ER -

Arman Vassighi, University of Waterloo

Oleg Semenov, University of Waterloo

Manoj Sachdev, University of Waterloo

Ali Keshavarzi, Intel Corporation

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250126

In deep sub-micron technologies, increased standby current in high performance processors will result in increased junction temperature. Evaluated temperature will have positive feedback on the standby current. If the temperature is not controlled, it may lead to the thermal runaway. In this paper we investigate the thermal management of high performance chips in the burn-in environment.

Citation:

Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi, "Thermal Management of High Performance Microprocessors," dft, pp.313, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003

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