A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment

D
DFT
2003
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03)
Abstract - A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Fengming Zhang Articles by Y.J. Lee Articles by T. Kane Articles by L. Schiano Articles by M. Momenzadeh Articles by Y-B Kim Articles by F.J. Meyer Articles by F. Lombardi Articles by S. Max Articles by Phil Perkinson

18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03)

Boston, Massachusetts

November 03-November 05

ISBN: 0-7695-2042-1

	ASCII Text	x
	Fengming Zhang, Y.J. Lee, T. Kane, L. Schiano, M. Momenzadeh, Y-B Kim, F.J. Meyer, F. Lombardi, S. Max, Phil Perkinson, "A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 159, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003.

	BibTex	x
	@article{ 10.1109/DFTVS.2003.1250108, author = {Fengming Zhang and Y.J. Lee and T. Kane and L. Schiano and M. Momenzadeh and Y-B Kim and F.J. Meyer and F. Lombardi and S. Max and Phil Perkinson}, title = {A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment}, journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on}, volume = {0}, year = {2003}, issn = {1063-6722}, pages = {159}, doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250108}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on TI - A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment SN - 1063-6722 SP EP A1 - Fengming Zhang, A1 - Y.J. Lee, A1 - T. Kane, A1 - L. Schiano, A1 - M. Momenzadeh, A1 - Y-B Kim, A1 - F.J. Meyer, A1 - F. Lombardi, A1 - S. Max, A1 - Phil Perkinson, PY - 2003 KW - null VL - 0 JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on ER -

Fengming Zhang, Northeastern University

Y.J. Lee, Northeastern University

T. Kane, LTX Corporation

L. Schiano, Northeastern University

M. Momenzadeh, Northeastern University

Y-B Kim, Northeastern University

F.J. Meyer, Northeastern University

F. Lombardi, Northeastern University

S. Max, LTX Corporation

Phil Perkinson, LTX Corporation

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250108

Recent research on modeling timing jitter has raised a requirement for a predictable, high magnitude, uniform, and wide bandwidth H-field. In this paper, a novel H-field generator design methodology is proposed. It consists of a single layer air core solenoid and a digital power switch driver that takes advantage of low power, wide bandwidth, and big current-driven capability. With input overdrive voltage, the digital switch can drive rail-to-rail voltage with output current up to 16A and power bandwidth more than 3 MHz.

This paper demonstrates a novel solenoid driver circuit to generate an accurate H-field by comparing digital and analog approaches and comparing the experimental data with the theoretical data.

Citation:

Fengming Zhang, Y.J. Lee, T. Kane, L. Schiano, M. Momenzadeh, Y-B Kim, F.J. Meyer, F. Lombardi, S. Max, Phil Perkinson, "A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment," dft, pp.159, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.