Detecting and Locating Faults in VLSI Implementations of the Advanced Encryption Standard

D
DFT
2003
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03)
Abstract - Detecting and Locating Faults in VLSI Implementations of the Advanced Encryption Standard

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	Similar Articles Articles by Guido Bertoni Articles by Luca Breveglieri Articles by Israel Koren Articles by Paolo Maistri Articles by Vincenzo Piuri

18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03)

Boston, Massachusetts

November 03-November 05

ISBN: 0-7695-2042-1

	ASCII Text	x
	Guido Bertoni, Luca Breveglieri, Israel Koren, Paolo Maistri, Vincenzo Piuri, "Detecting and Locating Faults in VLSI Implementations of the Advanced Encryption Standard," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 105, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003.

	BibTex	x
	@article{ 10.1109/DFTVS.2003.1250101, author = {Guido Bertoni and Luca Breveglieri and Israel Koren and Paolo Maistri and Vincenzo Piuri}, title = {Detecting and Locating Faults in VLSI Implementations of the Advanced Encryption Standard}, journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on}, volume = {0}, year = {2003}, issn = {1063-6722}, pages = {105}, doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250101}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on TI - Detecting and Locating Faults in VLSI Implementations of the Advanced Encryption Standard SN - 1063-6722 SP EP A1 - Guido Bertoni, A1 - Luca Breveglieri, A1 - Israel Koren, A1 - Paolo Maistri, A1 - Vincenzo Piuri, PY - 2003 KW - null VL - 0 JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on ER -

Guido Bertoni, Politecnico di Milano

Luca Breveglieri, Politecnico di Milano

Israel Koren, University of Massachusetts at Amherst

Paolo Maistri, Politecnico di Milano

Vincenzo Piuri, Università di Milano

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250101

Concurrent fault detection for hardware implementations of the Advanced Encryption Standard (AES) may provide protection against random faults, and against an attacker who may maliciously inject faults in order to find the encryption secret key. We have recently developed such a scheme which is based on the parity code. In this paper we prove that the parity-based code detects all odd-order faults and allows the location of the most single transient and permanent faults.

Citation:

Guido Bertoni, Luca Breveglieri, Israel Koren, Paolo Maistri, Vincenzo Piuri, "Detecting and Locating Faults in VLSI Implementations of the Advanced Encryption Standard," dft, pp.105, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003

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