loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Coded DNA Self-Assembly for Error Detection/Location
Chicago, Illinois
October 07-October 09
ISBN: 978-0-7695-3839-6
ASCII Text
x 
 
Zahra Mashreghian Arani, Masoud Hashempour, Fabrizio Lombardi, "Coded DNA Self-Assembly for Error Detection/Location," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 103-111, 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009.
 
 
BibTex
x
 
@article{ 10.1109/DFT.2009.13,
author = {Zahra Mashreghian Arani and Masoud Hashempour and Fabrizio Lombardi},
title = {Coded DNA Self-Assembly for Error Detection/Location},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2009},
issn = {1550-5774},
pages = {103-111},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2009.13},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - Coded DNA Self-Assembly for Error Detection/Location
SN - 1550-5774
SP103
EP111
A1 - Zahra Mashreghian Arani,
A1 - Masoud Hashempour,
A1 - Fabrizio Lombardi,
PY - 2009
KW - Coding
KW - Nano Manufacturing
KW - Error Detection
KW - Error Resilience
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
This paper proposes a novel framework in which DNA self-assembly can be analyzed for error detection/ location. The proposed framework relies on coding and mapping functions that allow to establish the presence of erroneous bonded tiles based on the pattern to be assembled (as defined by the tile set) and its current aggregate. As a widely used pattern and instantiation of this process, the Sierpinski Triangle self-assembly is analyzed in detail.
Index Terms:
Coding, Nano Manufacturing, Error Detection, Error Resilience
Citation:
Zahra Mashreghian Arani, Masoud Hashempour, Fabrizio Lombardi, "Coded DNA Self-Assembly for Error Detection/Location," dft, pp.103-111, 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009
Usage of this product signifies your acceptance of the Terms of Use.