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22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)
Comparing fail-safe microcontroller architectures in light of IEC 61508
Rome, Italy
September 26-September 28
ISBN: 0-7695-2885-6
ASCII Text
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Riccardo Mariani, Peter Fuhrmann, "Comparing fail-safe microcontroller architectures in light of IEC 61508," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 123-131, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007.
 
 
BibTex
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@article{ 10.1109/DFT.2007.63,
author = {Riccardo Mariani and Peter Fuhrmann},
title = {Comparing fail-safe microcontroller architectures in light of IEC 61508},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2007},
isbn = {0-7695-2885-6},
pages = {123-131},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2007.63},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - Comparing fail-safe microcontroller architectures in light of IEC 61508
SN - 0-7695-2885-6
SP123
EP131
A1 - Riccardo Mariani,
A1 - Peter Fuhrmann,
PY - 2007
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
Riccardo Mariani, YOGITECH SpA
Peter Fuhrmann, Philips Research Europe, Germany
In this paper, an overview is given on the main architectures used in the automotive to implement fail-safe microcontrollers. The concept of a new HW-centric, distributed and optimized architecture is also presented. In light of the IEC 61508 norm for safety related electronic systems, a comparisons between these different architectures is done based on a reference design. The paper concludes discussing how the presented architectures can be extended to become fail-functional.
Citation:
Riccardo Mariani, Peter Fuhrmann, "Comparing fail-safe microcontroller architectures in light of IEC 61508," dft, pp.123-131, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007
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