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22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)
Online NoC Switch Fault Detection and Diagnosis Using a High Level Fault Model
Rome, Italy
September 26-September 28
ISBN: 0-7695-2885-6
ASCII Text
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Armin Alaghi, Naghmeh Karimi, Mahshid Sedghi, Zainalabedin Navabi, "Online NoC Switch Fault Detection and Diagnosis Using a High Level Fault Model," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 21-29, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007.
 
 
BibTex
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@article{ 10.1109/DFT.2007.55,
author = {Armin Alaghi and Naghmeh Karimi and Mahshid Sedghi and Zainalabedin Navabi},
title = {Online NoC Switch Fault Detection and Diagnosis Using a High Level Fault Model},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2007},
isbn = {0-7695-2885-6},
pages = {21-29},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2007.55},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - Online NoC Switch Fault Detection and Diagnosis Using a High Level Fault Model
SN - 0-7695-2885-6
SP21
EP29
A1 - Armin Alaghi,
A1 - Naghmeh Karimi,
A1 - Mahshid Sedghi,
A1 - Zainalabedin Navabi,
PY - 2007
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
Armin Alaghi, University of Tehran, 14399 Tehran, IRA
Naghmeh Karimi, University of Tehran, 14399 Tehran, IRA
Mahshid Sedghi, University of Tehran, 14399 Tehran, IRA
Zainalabedin Navabi, University of Tehran, 14399 Tehran, IRA
This paper presents an efficient method for online testing of NoC switches. This method deals with control faults of NoC switches; i.e. the routing faults which cause NoC packets to be sent to output ports not intended to. A high level fault model has been proposed in this paper to model switch routing faults. The proposed method is evaluated by fault simulation that is based on our high-level fault model. This simulation and evaluation environment is modeled at the transaction level in VHDL.
Citation:
Armin Alaghi, Naghmeh Karimi, Mahshid Sedghi, Zainalabedin Navabi, "Online NoC Switch Fault Detection and Diagnosis Using a High Level Fault Model," dft, pp.21-29, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007
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