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22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)
Estimating Error Propagation Probabilities with Bounded Variances
Rome, Italy
September 26-September 28
ISBN: 0-7695-2885-6
ASCII Text
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Hossein Asadi, Mehdi B. Tahoori, Chandra Tirumurti, "Estimating Error Propagation Probabilities with Bounded Variances," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 41-49, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007.
 
 
BibTex
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@article{ 10.1109/DFT.2007.51,
author = {Hossein Asadi and Mehdi B. Tahoori and Chandra Tirumurti},
title = {Estimating Error Propagation Probabilities with Bounded Variances},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2007},
isbn = {0-7695-2885-6},
pages = {41-49},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2007.51},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - Estimating Error Propagation Probabilities with Bounded Variances
SN - 0-7695-2885-6
SP41
EP49
A1 - Hossein Asadi,
A1 - Mehdi B. Tahoori,
A1 - Chandra Tirumurti,
PY - 2007
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
Hossein Asadi, Northeastern University Boston, MA
Mehdi B. Tahoori, Northeastern University Boston, MA
Chandra Tirumurti, Intel Corporation
Fast and accurate estimation of soft error rate (SER) is essential in obtaining the reliability parameters of a digital system and cost-effective reliability improvements. In this paper we present an approach to obtain uncertainty bounds on the error propagation probability (EPP) values used in SER estimation based on an analytical approach. We demonstrate how we can compute EPP values and their uncertainty bounds (variances) by examining the logic gates in a topological order. Comparison of this method with the Monte-Carlo (MC) fault simulation approach confirms the accuracy of the presented technique for both the computed EPP values and uncertainty bounds. Also, this technique is 3-5 orders of magnitude faster than fault simulation.
Citation:
Hossein Asadi, Mehdi B. Tahoori, Chandra Tirumurti, "Estimating Error Propagation Probabilities with Bounded Variances," dft, pp.41-49, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007
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