Safety Evaluation of NanoFabrics

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	Similar Articles Articles by Michelangelo Grosso Articles by Maurizio Rebaudengo Articles by Matteo Sonza Reorda

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)

Rome, Italy

September 26-September 28

ISBN: 0-7695-2885-6

	ASCII Text	x
	Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda, "Safety Evaluation of NanoFabrics," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 418-426, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007.

	BibTex	x
	@article{ 10.1109/DFT.2007.50, author = {Michelangelo Grosso and Maurizio Rebaudengo and Matteo Sonza Reorda}, title = {Safety Evaluation of NanoFabrics}, journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on}, volume = {0}, year = {2007}, isbn = {0-7695-2885-6}, pages = {418-426}, doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2007.50}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on TI - Safety Evaluation of NanoFabrics SN - 0-7695-2885-6 SP418 EP426 A1 - Michelangelo Grosso, A1 - Maurizio Rebaudengo, A1 - Matteo Sonza Reorda, PY - 2007 KW - null VL - 0 JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on ER -

Michelangelo Grosso, Politecnico di Torino, Torino, Italy

Maurizio Rebaudengo, Politecnico di Torino, Torino, Italy

Matteo Sonza Reorda, Politecnico di Torino, Torino, Italy

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DFT.2007.50

Chemically Assembled Electronic Nanotechnology is a promising alternative to CMOS fabrication. In particular, the nanoFabric has proven to be a viable solution for implementing digital circuits. The paper proposes some preliminary considerations about safety of application-oriented nanoFabrics based on some results obtained through an automated platform for fault simulation. In particular, a single-fault detecting methodology is proposed and evaluated. Different fault models have been taken into account in order to evaluate alternative scenarios.

Citation:

Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda, "Safety Evaluation of NanoFabrics," dft, pp.418-426, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007

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