Michele Favalli, "Delay Fault Detection Problems in Circuits Feautring a Low Combination Depth," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 170-178, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007.

@article{ 10.1109/DFT.2007.18,
author = {Michele Favalli},
title = {Delay Fault Detection Problems in Circuits Feautring a Low Combination Depth},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2007},
isbn = {0-7695-2885-6},
pages = {170-178},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2007.18},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - Delay Fault Detection Problems in Circuits Feautring a Low Combination Depth
SN - 0-7695-2885-6
SP170
EP178
A1 - Michele Favalli,
PY - 2007
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -