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22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)
Delay Fault Detection Problems in Circuits Feautring a Low Combination Depth
Rome, Italy
September 26-September 28
ISBN: 0-7695-2885-6
Michele Favalli, Univ. of Ferrara, Italy
Citation:
Michele Favalli, "Delay Fault Detection Problems in Circuits Feautring a Low Combination Depth," dft, pp.170-178, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007
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