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22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)
Soft Error Hardening for Asynchronous Circuits
Rome, Italy
September 26-September 28
ISBN: 0-7695-2885-6
ASCII Text
x 
 
Weidong Kuang, Casto Manuel Ibarra, Peiyi Zhao, "Soft Error Hardening for Asynchronous Circuits," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 273-281, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007.
 
 
BibTex
x
 
@article{ 10.1109/DFT.2007.15,
author = {Weidong Kuang and Casto Manuel Ibarra and Peiyi Zhao},
title = {Soft Error Hardening for Asynchronous Circuits},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2007},
isbn = {0-7695-2885-6},
pages = {273-281},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2007.15},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - Soft Error Hardening for Asynchronous Circuits
SN - 0-7695-2885-6
SP273
EP281
A1 - Weidong Kuang,
A1 - Casto Manuel Ibarra,
A1 - Peiyi Zhao,
PY - 2007
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
Weidong Kuang, University of Texas Pan American, Edinburg
Casto Manuel Ibarra, University of Texas Pan American, Edinburg
Peiyi Zhao, Chapman University, Orange, CA
Citation:
Weidong Kuang, Casto Manuel Ibarra, Peiyi Zhao, "Soft Error Hardening for Asynchronous Circuits," dft, pp.273-281, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007
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