Soft Error Hardening for Asynchronous Circuits

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22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)

Rome, Italy

September 26-September 28

ISBN: 0-7695-2885-6

	ASCII Text	x
	Weidong Kuang, Casto Manuel Ibarra, Peiyi Zhao, "Soft Error Hardening for Asynchronous Circuits," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 273-281, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007.

	BibTex	x
	@article{ 10.1109/DFT.2007.15, author = {Weidong Kuang and Casto Manuel Ibarra and Peiyi Zhao}, title = {Soft Error Hardening for Asynchronous Circuits}, journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on}, volume = {0}, year = {2007}, isbn = {0-7695-2885-6}, pages = {273-281}, doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2007.15}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on TI - Soft Error Hardening for Asynchronous Circuits SN - 0-7695-2885-6 SP273 EP281 A1 - Weidong Kuang, A1 - Casto Manuel Ibarra, A1 - Peiyi Zhao, PY - 2007 KW - null VL - 0 JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on ER -

Weidong Kuang, University of Texas Pan American, Edinburg

Casto Manuel Ibarra, University of Texas Pan American, Edinburg

Peiyi Zhao, Chapman University, Orange, CA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DFT.2007.15

Citation:

Weidong Kuang, Casto Manuel Ibarra, Peiyi Zhao, "Soft Error Hardening for Asynchronous Circuits," dft, pp.273-281, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007

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