A Novel Methodology for Functional Test Data Compression

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Hamidreza Hashempour Articles by Fabrizio Lombardi

21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'06)

Arlington, Virginia, USA

October 04-October 06

ISBN: 0-7695-2706-X

	ASCII Text	x
	Hamidreza Hashempour, Fabrizio Lombardi, "A Novel Methodology for Functional Test Data Compression," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 128-135, 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'06), 2006.

	BibTex	x
	@article{ 10.1109/DFT.2006.9, author = {Hamidreza Hashempour and Fabrizio Lombardi}, title = {A Novel Methodology for Functional Test Data Compression}, journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on}, volume = {0}, year = {2006}, issn = {1550-5774}, pages = {128-135}, doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.9}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on TI - A Novel Methodology for Functional Test Data Compression SN - 1550-5774 SP128 EP135 A1 - Hamidreza Hashempour, A1 - Fabrizio Lombardi, PY - 2006 KW - null VL - 0 JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on ER -

Hamidreza Hashempour, Northeastern University, USA

Fabrizio Lombardi, Northeastern University, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DFT.2006.9

This paper presents a novel approach for compressing functional test data in Automatic Test Equipment (ATE). A practical technique is presented for 2 Dimensional (2D) reordering of test data in which additionally to test vector reordering, column reordering is also applied. An ATE based approach to extract the original test vectors from the 2D ordered data is presented. The advantage of the approach is substantiated using the figure of merit of entropy for the 2D ordered test data of ISCAS benchmark circuits.

Citation:

Hamidreza Hashempour, Fabrizio Lombardi, "A Novel Methodology for Functional Test Data Compression," dft, pp.128-135, 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'06), 2006

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.