Testing Reversible 1D Arrays for Molecular QCA

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21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'06)

Arlington, Virginia, USA

October 04-October 06

ISBN: 0-7695-2706-X

	ASCII Text	x
	X. Ma, J. Huang, C. Metra, F. Lombardi, "Testing Reversible 1D Arrays for Molecular QCA," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 71-79, 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'06), 2006.

	BibTex	x
	@article{ 10.1109/DFT.2006.63, author = {X. Ma and J. Huang and C. Metra and F. Lombardi}, title = {Testing Reversible 1D Arrays for Molecular QCA}, journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on}, volume = {0}, year = {2006}, issn = {1550-5774}, pages = {71-79}, doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.63}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on TI - Testing Reversible 1D Arrays for Molecular QCA SN - 1550-5774 SP71 EP79 A1 - X. Ma, A1 - J. Huang, A1 - C. Metra, A1 - F. Lombardi, PY - 2006 KW - Reversible computing KW - QCA KW - emerging technologies. VL - 0 JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on ER -

X. Ma, Northeastern University, USA

J. Huang, Northeastern University, USA

C. Metra, University of Bologna, Italy

F. Lombardi, Northeastern University, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DFT.2006.63

Reversible logic design is a well-known paradigm in digital computation. While an extensive literature exists on its mathematical characterization, little work has been reported on its possible technological basis. In this paper, Quantum-dot Cellular Automata (QCA) is investigated for testable implementations of reversible logic. Two new reversible gates (denoted as QCA1 and QCA2) are proposed. These gates are compared (in terms of delay, area and logic synthesis) with other reversible gates (such as Toffoli and Fredkin) for QCA implementation. As the bijective nature of reversibility makes testing significantly easier than in the general case, testing of the reversible gates is pursued in detail. C-testability of a 1D array is investigated for single cell fault as well multiple cell faults. Defect analysis of the reversible gates is pursued under a single missing/additional cell assumption.

Index Terms:

Reversible computing, QCA, emerging technologies.

Citation:

X. Ma, J. Huang, C. Metra, F. Lombardi, "Testing Reversible 1D Arrays for Molecular QCA," dft, pp.71-79, 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'06), 2006

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