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21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'06)
Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies
Arlington, Virginia, USA
October 04-October 06
ISBN: 0-7695-2706-X
ASCII Text
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Michelle L. La Haye, Cory Jung, David Chen, Glenn H. Chapman, Jozsef Dudas, "Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 448-456, 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'06), 2006.
 
 
BibTex
x
 
@article{ 10.1109/DFT.2006.31,
author = {Michelle L. La Haye and Cory Jung and David Chen and Glenn H. Chapman and Jozsef Dudas},
title = {Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2006},
issn = {1550-5774},
pages = {448-456},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.31},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies
SN - 1550-5774
SP448
EP456
A1 - Michelle L. La Haye,
A1 - Cory Jung,
A1 - David Chen,
A1 - Glenn H. Chapman,
A1 - Jozsef Dudas,
PY - 2006
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
Michelle L. La Haye, Simon Fraser University, Canada
Cory Jung, Simon Fraser University, Canada
David Chen, Simon Fraser University, Canada
Glenn H. Chapman, Simon Fraser University, Canada
Jozsef Dudas, Simon Fraser University, Canada
A Fault Tolerant Active Pixel Sensor (FTAPS) has been designed and fabricated to correct for point defects that occur in CMOS image sensors both at manufacturing and over the lifetime of the sensor. For some time it has been known that fabrication of CMOS image sensors in processes less than 0.35?m would generate significant performance changes, yet imagers are being fabricated in 0.18?m technology or smaller. Therefore the characteristics of the FTAPS are presented for pixels fabricated in both a standard 0.18?m and 0.35?m CMOS process and compared for consistency.
Citation:
Michelle L. La Haye, Cory Jung, David Chen, Glenn H. Chapman, Jozsef Dudas, "Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies," dft, pp.448-456, 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'06), 2006
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