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21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'06)
Equivalent IDDQ Tests for Systems with Regulated Power Supply
Arlington, Virginia, USA
October 04-October 06
ISBN: 0-7695-2706-X
ASCII Text
x 
 
Chuen-Song Chen, Jien-Chung Lo, Tian Xia, "Equivalent IDDQ Tests for Systems with Regulated Power Supply," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 291-299, 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'06), 2006.
 
 
BibTex
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@article{ 10.1109/DFT.2006.28,
author = {Chuen-Song Chen and Jien-Chung Lo and Tian Xia},
title = {Equivalent IDDQ Tests for Systems with Regulated Power Supply},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2006},
issn = {1550-5774},
pages = {291-299},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.28},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - Equivalent IDDQ Tests for Systems with Regulated Power Supply
SN - 1550-5774
SP291
EP299
A1 - Chuen-Song Chen,
A1 - Jien-Chung Lo,
A1 - Tian Xia,
PY - 2006
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
Chuen-Song Chen, University of Rhode Island, USA
Jien-Chung Lo, University of Rhode Island, USA
Tian Xia, University of Vermont, USA
This paper presents an equivalent current sensing technique for the applications of IDDQ tests. This is accomplished by monitoring the operations of existing on-chip voltage regulators, which indirectly provides the IDDQ information. Equivalent IDDQ information is obtained by measuring an internal voltage signal of a regulator. Then, the measured data is shifted out using the IEEE 1149.1 standard. IDDQ based test methods are used to postprocess those data for screening defective circuits. Experiments were successfully conducted assuming the TSMC 0.18?m CMOS technology.
Citation:
Chuen-Song Chen, Jien-Chung Lo, Tian Xia, "Equivalent IDDQ Tests for Systems with Regulated Power Supply," dft, pp.291-299, 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'06), 2006
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