An Approach to Minimizing Functional Constraints

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	Similar Articles Articles by Abhijit Jas Articles by Yi-Shing Chang Articles by Sreejit Chakravarty

21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'06)

Arlington, Virginia, USA

October 04-October 06

ISBN: 0-7695-2706-X

	ASCII Text	x
	Abhijit Jas, Yi-Shing Chang, Sreejit Chakravarty, "An Approach to Minimizing Functional Constraints," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 215-226, 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'06), 2006.

	BibTex	x
	@article{ 10.1109/DFT.2006.13, author = {Abhijit Jas and Yi-Shing Chang and Sreejit Chakravarty}, title = {An Approach to Minimizing Functional Constraints}, journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on}, volume = {0}, year = {2006}, issn = {1550-5774}, pages = {215-226}, doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.13}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on TI - An Approach to Minimizing Functional Constraints SN - 1550-5774 SP215 EP226 A1 - Abhijit Jas, A1 - Yi-Shing Chang, A1 - Sreejit Chakravarty, PY - 2006 KW - null VL - 0 JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on ER -

Abhijit Jas, Intel Corporation

Yi-Shing Chang, Intel Corporation

Sreejit Chakravarty, Intel Corporation

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DFT.2006.13

Functional constraints are an integral part of the VLSI design methodology. Pseudofunctional scan ATPG and untestable fault identification are two areas in test where functional constraints are widely used. The number and complexity of these constraints for large designs become a limiting factor in their successful usage. In this paper we define a constraint minimization problem and present a powerful framework to simplify such constraints. The feasibility and effectiveness of this approach is demonstrated by using untestability analysis of large industrial benchmarks as a case study.

Citation:

Abhijit Jas, Yi-Shing Chang, Sreejit Chakravarty, "An Approach to Minimizing Functional Constraints," dft, pp.215-226, 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'06), 2006

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