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19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04)
At-Speed Functional Verification of Programmable Devices
Cannes, France
October 10-October 13
ISBN: 0-7695-2241-6
ASCII Text
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Nicola Bombieri, Franco Fummi, Graziano Pravadelli, "At-Speed Functional Verification of Programmable Devices," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 386-394, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04), 2004.
 
 
BibTex
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@article{ 10.1109/DFT.2004.13,
author = {Nicola Bombieri and Franco Fummi and Graziano Pravadelli},
title = {At-Speed Functional Verification of Programmable Devices},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2004},
issn = {1550-5774},
pages = {386-394},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2004.13},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - At-Speed Functional Verification of Programmable Devices
SN - 1550-5774
SP386
EP394
A1 - Nicola Bombieri,
A1 - Franco Fummi,
A1 - Graziano Pravadelli,
PY - 2004
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
Nicola Bombieri, Universit? di Verona
Franco Fummi, Universit? di Verona
Graziano Pravadelli, Universit? di Verona
In this paper we present a novel approach for functional verification of programmable devices. The proposed methodology is suited to refine the results obtained by a functional Automatic Test Pattern Generator (ATPG). The hard-to-detect faults are examined by exploiting the controllability ability of a high-level ATPG in conjunction with the observability potentiality of software instructions targeted to the programmable device. Generated test programs can be used for both functional verification and at-speed testing.
Citation:
Nicola Bombieri, Franco Fummi, Graziano Pravadelli, "At-Speed Functional Verification of Programmable Devices," dft, pp.386-394, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04), 2004
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