4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) Calibration and Debugging of Multi-step Analog to Digital Converters January 23-January 25 ISBN: 978-0-7695-3110-6
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.82
This paper reports a new approach for debugging of the analog to digital converters based on process monitoring and extended design-for-test implementation. The circuit is reconfigured in such a way that all subblocks are analysed and tested for their full input range allowing full observability and controllability of the analog to digital converter. To set initial data, estimate the parameter update and to guide the test, dedicated monitors have been designed. Additionally, the second presented algorithm allow circuit calibration without explicit need for any dedicated test signal nor requires a part of the conversion time. It works continuously and with every signal applied to the ADC.
Index Terms:
multi-step ADC, debugging, design-for-test, calibration
Citation:
Amir Zjajo, Jose Pineda de Gyvez, "Calibration and Debugging of Multi-step Analog to Digital Converters," delta, pp.512-515, 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008), 2008 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||